This standard specifies the test methods for lead vapor deposition (VD) protective films in integrated circuits for aerospace use, including film thickness measurement, density detection, water resistance testing, etc., to ensure the Stability and Reliability of the protective film in the aerospace environment.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | A29 | ICS | 49.040 |
| Release Date | 2023-09-07 00:00:00 | Implementation Date | 2024-01-01 00:00:00 |