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$601.00
SE
INESA SGW X-4 Melting point meter
RT+~320℃Capillary method, hot table methodvisual±1℃(≤200℃)；±2℃(>200℃)±1℃(≤200℃)；±2℃(>200℃)
Microscope observation, support capillary method and hot table method to determine melting point, suitable for crystalline organic compounds in chemical, Spinning & weaving, fuel and other fields. Microscope magnification up to 40X, temperature range RT +~ 320 ℃, temperature resolution of 1 ℃
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