Germany PHYNIX Sur fix ® E - N non-ferrous statistical film thickness meter
Surfix ® E Family Series Surfix N is a non-iron based statistical film thickness meter, with N1.5 external fixed probe, Measurement range 1~ 1500μm, Surfix galvanized layer Thickness Gauge adopts eddy Current Measurement principle to measure non-ferrous metal substrate coated platings, Measurement accuracy +/- (1μm + 1% Measured value), resolution up to 0.1μm. With infrared interface for convenient data transmission, host Protection level IP52.
PHYNIX
Surfix®E-N
Surfix SX-N1.5
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Surfix® E Family series Surfix N is a non-iron-based statistical film thickness meter, with N1.5 external fixed probe, the measurement range is 1~1500μm, and the eddy current measurement principle can measure the coating on non-ferrous metal substrates, with a measurement accuracy of ± (1μm + 1% measured value) and a resolution of 0.1μm. With infrared interface for convenient data transmission, the host protection level is IP52.
Application
electroplate
paint
Automotive industry
chemical industry
Aerospace
shipbuilding
Tire manufacturing industry
Specifications
| Principle | Eddy current |
| Measuring range | 0~1500μm |
| precision | ± (1 μm + 1% m) |
| resolution | 0.1 μm or < 0.2% of the measured value |
| display | Backlit, 4 alphanumeric, height 10 mm (0.4 inches) |
| Calibration method | Factory calibration, zero point calibration, thin film calibration Drift function: plus or minus a constant value |
| statistics | Number of measurements, average, standard deviation, minimum, maximum |
| Data storage | 2*100 measurements |
| interface | Infrared/wire |
| Operating temperature | 0℃~60℃ |
| Surface temperature | -15℃~60℃ |
| Specifications | 137mm*66mm*23mm |
| Probe specifications | ∅14mm*83mm |
| weight | 205g with probe and battery |
| Ingress protection | IP 52 (dust and dripping resistant) |
| standard | DIN, ISO, ASTM, BS |
Limit values
| The convex surface has the smallest radius of curvature | 1.5mm |
| The concave surface has the smallest radius of curvature | 5mm |
| Minimum operating height | 115mm |
| Smallest measuring area | 5×5mm |
| Minimum substrate thickness - N | 50μm |
PHYNIX Surfix®E-N Film thickness meterSpecifications
| LIST | VALUE |
|---|---|
| Measurement principle | eddy Current |
| Measurement range | 0~1500μm |
| margin of error | ±1% |
| resolution | 0.1μm |
| Minimum measurement surface | 5*5mm |
| Minimum radius of curvature | Convex 1.5mm; Concave 5mm |
| thinnest substrate | 50μm |
| probe | Line probe |
| Probe size | Φ14*83mm |
| Calibrated mode | Factory calibrated, zero calibrated and film calibrated |
| statistical function | Measurement times, MAX Maximum, MIN Minimum, Average, Standard deviation |
| icon function | none |
| Interface | Infrared |
| Data storage | 2 × 100 Measured values |
| Standards | DIN，ISO，ASTM，BS |
| Display screen | Backlit, 4-digit alphanumeric, height 10mm (0.4 inches) |
| Operating temperature | 0~60℃ |
| Protection level | IP52 |
| Weight | 205G (including probe and battery) |
| Dimension | 137*66*23mm |
| Probe contact temperature | -15~60℃ |
PHYNIX Surfix®E-N Film thickness meter Packing list
Surfix N thickness gauge, protective case, calibration shim, suitcase, AAA battery, data transfer software, manufacturer's certificate, instruction manual.
[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.
