Germany PHYNIX Surfix ® easy X E-FN easy-to-use external probe dual-use type Film thickness meter
German PHYNIX Surfix ® easy X E-FN Film thickness meter is an external probe, magnetic Induction + eddy Current dual-use, automatic identification of metal substrate, can measure 3500 μm iron-based film thickness or 3000 μm non-ferrous metal substrate thickness, 2% Measurement accuracy, provide factory verification certificate.
PHYNIX
Surfix® easy X E-FN
Easy x I-FN HR
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The Surfix® easy X-series Film Thickness Gauges are designed for everyday use and demanding laboratory measurements. The Surfix®easy X series is a new Film Thickness Gauge available in 4 versions:
Surfix® easy X I-FN: built-in probe, magnetic induction + eddy current
Surfix® easy X I-F: built-in probe, magnetic sensing
Surfix® easy X E-FN: external probe, magnetic induction + eddy current
Surfix® easy X E-F: external probe, magnetic sensing
The specific differences of the Surfix® easy X series Film Thickness Gauges can be found in the table below:
| easy X series | Surfix® easy X I-FN / I-F | Surfix® easy X E-FN / E-F |
| Built-in probes | ||
| Minimum convex radius of curvature | ||
Application
Paints, coatings, automobile manufacturing, ships, steel construction, etc.
merit
1. No calibration, you can measure when you turn on the machine;
2. Backlight display, easy to measure in dark environment;
3. Precise and precise measurements can be made on flat, rough and curved surfaces
4. Automatic identification of substrate measurement of iron/steel and non-ferrous metals
5. Online statistics (quantity, mean, standard deviation, minimum, maximum)
6. Large contact area, more convenient positioning
7. Manufacturer's test certificate
PHYNIX Surfix® easy X E-FN Easy-to-use external probe dual-use film thickness meterSpecifications
| LIST | VALUE |
|---|---|
| Measurement principle | Magnetic Induction + eddy Current |
| Measurement range | F：0~3500μm；N：0~3000μm |
| margin of error | ±2% |
| resolution | 1μm|2μm|5μm |
| Minimum measurement surface | 10*10mm |
| Minimum radius of curvature | Convex 5mm; Concave 50mm |
| thinnest substrate | 0.5mm(F)；50μm(N) |
| probe | External probe |
| Probe size | Φ24*45mm |
| Calibrated Certificate | Manufacturer Certificate |
| Calibrated mode | Factory calibrated, zero calibrated |
| Unit display | µm/mils |
| statistical function | MAX Maximum, MIN Minimum, Average, Standard deviation |
| Power Supply | AAA battery × 2 |
| Standards | DIN，ISO，ASTM，BS |
| Display screen | Backlight, 4 alphanumeric, height 8mm |
| Operating temperature | 0℃~50℃ |
| Protection level | IP52 |
| Weight | 140G with battery |
| Dimension | 110*50*25mm |
| Probe contact temperature | -15~60℃ |
PHYNIX Surfix® easy X E-FN Easy-to-use external probe dual-use film thickness meter Packing list
Film thickness meter with probe, rubber protective cover, calibration shim, AAA battery, operation manual, manufacturer's certificate
[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.
