YINUO YN-DLD100 Quantitative Sampler 0~1.0mm
YINUO YN-DLD100 quantitative sample Sampler is used for gram weight detection sampling of paper Cardboard samples. The stamping sampling method is used to quickly and accurately cut 100cm2 standard samples. YN-DLD100 quantitative Sampler sampling area is 100cm2, sampling area error is +/- 0.35 cm2, Precision +/- 0.2mm, sampling thickness (0.1~ 1.0) mm, (0.1~ 3.0) mm (selected according to requirements).
YiNuo
YN-DLD100
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CHENCHI DL-100 Special sampling instrument for quantitative Sampler paper weight determination 100cm2
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use
YN-DLD100 quantitative sampler, also known as circular quantitative sampler, is used for the weight detection and sampling of paper and cardboard samples. It adopts stamping sampling method and can quickly and accurately cut 100cm2 standard samples. This product uses special processing mold blades, not special high-strength Material or man-made damage does not need to replace the blade. It is used to detect the weight per unit area of sheet materials such as paper, cardboard, textiles, toilet paper and sanitary napkins, copper foil and aluminum foil, expressed as g/m2 in grams per square meter.
The importance of correct sample preparation and careful data processing is self-evident. This test method has the necessary instruments for laboratory grammage testing to ensure that every weighing can provide accurate data from the first time. It is suitable for Paper laboratory and quality inspection department.
Test principle: cut a standard sample of 100cm2 by using a quantitative sampler, then put the sample on the balance for weighing, and calculate the weight of the product by calculating the weighing result.
Executive standard
GB/T 451.2, ISO 536, QB/T1671, GB/T460, GB/T1540, GB/T426
Application
| basic application | film, sheet | Thickness measurement of various plastic films, sheets, diaphragms, etc. |
| Paper | Thickness measurement of various paper, cardboard, composite cardboard, etc. | |
| extended application | metal sheet, silicon chip | Thickness measurement of silicon wafers, foils, various metal sheets, etc. |
| corrugated cardboard | Thickness determination of corrugated cardboard | |
| textile material | Thickness determination of various textile materials such as woven fabrics, knitted fabrics, coated fabrics, etc. | |
| Non-woven | Thickness measurement of various nonwoven fabrics such as diapers, sanitary napkins, medical masks, etc. | |
| other materials | Thickness determination of solid electrical insulating materials, adhesive tapes, geosynthetics, rubber, etc. |
YiNuo YN-DLD100 Quantitative SamplerSpecifications
| LIST | VALUE |
|---|---|
| Sampling area | 100cm² |
| Sampling error | ±0.35cm² |
| Accuracy | ±0.2mm |
| Film thickness sampling range | 0.1~ 1.0mm, 0.1~ 3.0mm (selected according to requirements) |
| Dimensions | 220*300*435mm |
| Weight | 25kg |
| Operating Environment | Temperature (20 +/- 10) ℃, humidity < 85% |
YiNuo YN-DLD100 Quantitative Sampler Packing list
host X1, manual X1, certificate X1, warranty card X1
[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.
