Leeb LBTQ501 Ultrasonic flaw detection (UFD) instrument DATASHEET
| Brand | Leeb | Model | LBTQ501 |
|---|---|---|---|
| From | China | Name | Ultrasonic flaw detection (UFD) instrument |
Specifications
| Scanning range (mm) | 0～6000 |
| vertical linearity error | ≦4% |
| horizontal linearity error | ≦0.1% |
| Flaw Detection Sensitivity Margin | ☺ 60dB (depth 200mm φ 2 flat bottom hole) |
| dynamic range | ≧32dB |
| resolution | ≧36dB |
| Frequency range (MHz) | 0.5～20 |
| Gain adjustment (dB) | 0～110 |
| Material sound velocity (m/s) | 1000～9999 |
| echo suppression | 0～80% |
| Operating temperature (℃) | -27～70 |
| Dimensions (mm) | 240*160*40 |
| Weight (Kg) | 1.3 |
| optional | Probe, standard test block, laptop, PC communication software, BNC cable |
Packing list
After-sales instructions
None
[Note] For after-sales services outside the Chinese mainland, if the instrument requires repair, the shipping and possible associated taxes shall be borne by the sender. Generation address of the manual: http://en.nbchao.com/p/50922/Specification.html , which is only used by users who purchase commodities from the NBCHAO.
Created on : 2026/03/01